深圳市瑞普高電子有限公司
深圳市瑞普高電子有限公司
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Exfo IQ-3400 PDL / OL計
The Exfo IQ-3400 Series PDL/Optical Loss Meters was developed for the IQ-200 Optical Test System.
Exfo IQ-3400 PDL / OL計 Exfo IQ-3400 PDL / OL計
Exfo IQ-3400 Series PDL/Optical Loss Meters
Features
Complete Loss Analysis Solution
Average and standard deviation reporting on multiple measurements
High resolution: 0.001 dB
Coupling Ratio
Description
The Exfo IQ-3400 Series PDL/Optical Loss Meters was developed for the IQ-200 Optical Test System. They are designed for laboratory and manufacturing measurement applications using the IQ-203 Mainframe or an IQ-206 PC Expansion Card.
IQ-3400:
The IQ-3400 can perform complete component characterization with the following measurements: polarization dependent loss; insertion loss; optical return loss; excess loss; coupling ratio; polarization dependent coupling ratio; and reference power. Standard deviation, averaging and a graphical interface allow for complete component characterization.
IQ-3400B:
The Exfo IQ-3400B PDL/OL Meter uses the scanning method for simple, flexible component characterization on the production floor. Start with a laser source, use the IQ-5100B to scramble the polarization state of the signal, and then take a power acquisition with the IQ-3400B. Getting reliable PDL measurements is easy with the streamlined IQ PDL test setup.
Back up your PDL measurements with the IQ-3400B's optical return loss (ORL) test function. PDL can be caused by ORL from a scratched connector. If the PDL reading on a connectorized device seems unusually high, the ORL tester lets you check for loss due to connector damage.
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