驗證和調試當今的高速、低壓DDR內存接口信號需要探測解決方案，能夠從各種各樣的形式因素中準確地獲取，并提供良好的信號保真度。Tektronix邏輯分析儀探頭包含多種連接選項，這些選項的設計目的是確保信號采集是設計性能的真實反映。
關鍵特性
<0.7 pF總電容負載最小化對電路的干擾
20 k?輸入電阻
6.5 Vp-p動態范圍支持廣泛的邏輯族
通用探測允許靈活地連接到工業標準連接
無連接器探測系統無需板載連接器
應用程序
DDR3/DDR4調試和驗證
LPDDR調試和驗證
嵌入式系統集成、調試和驗證
的實時數字系統分析探針解決方案
P6900系列探針
DDR內存接口已經發展到可以在較低電壓下支持較高的數據速率，這帶來了一些調試和驗證方面的挑戰。P6900是業界容量的DDR內存應用專用探頭，它提供了良好的信號完整性，以確保信號的真實表示——這對于連接到高速內存接口并執行調試和分析至關重要。
對于不同的應用程序，可以使用具有各種附件機制的探針。在電路板空間昂貴的地方，高密度P6960DBL和P6962DBL探頭與D-Max®探測技術提供了業界最小的可用空間。對于插入器，P6960HCD、P6960HCD- lv和P6962HCD提供了一個低配置的連接機制，使機械上易于使用插入器。對于低信號擺幅應用，適用于基于D-Max®探測技術的P6960HS。
為了調試高速DDR總線上常見的信號完整性問題，用于DDR應用程序的P6900專用探針與TLA7Bxx模塊一起工作，以提供iCapture™同時數字模擬采集。這使您可以清楚地看到與時間相關的數字和模擬行為的設計，沒有額外的電容和設置時間的雙重探測。
Verification and debug of today's high speed, low voltage DDR Memory interface signals requires probing solutions that can accurately acquire from a wide variety of form factors and provide excellent signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance.
Key features
<0.7 pF total capacitive loading minimizes intrusion on circuits
20 k? input resistance
6.5 Vp-p dynamic range supports a broad range of logic families
General-purpose probing allows flexible attachment to industry- standard connections
Connectorless probing system eliminates need for onboard connectors
Applications
DDR3/DDR4 Debug and Verification
LPDDR Debug and Validation
Embedded Systems integration, debug, and verification
Leading probe solutions for real-time digital systems analysis
P6900 series probes
The DDR memory interface has evolved to support higher data rates at lower voltages creating several debug and validation challenges. With the industry's lowest capacitance, the P6900 specialty probes for DDR Memory applications offer excellent signal integrity to ensure a true representation of the signal - critical for connecting to high-speed memory interfaces and performing debug and analysis.
Probes with a variety of attachment mechanisms for different applications are available. Where circuit board space is at a premium, the high-density P6960DBL and P6962DBL probes with D-Max® Probing Technology offers the industry's smallest available footprint. For use with interposers, the P6960HCD, P6960HCD-LV and P6962HCD offer a low profile connection mechanism making it mechanically easy to use with the interposers. For low signal swing application the P6960HS based on the D-Max® Probing Technology is suitable.
For debugging the signal integrity problems common on high-speed DDR buses, the P6900 specialty probes for DDR applications work with the TLA7Bxx modules to provide iCapture™ simultaneous digital-analog acquisition. This allows you to clearly see the time-correlated digital and analog behavior of your design, without the extra capacitance and setup time of double probing.
