主要特性與技術(shù)指標(biāo)
B1506A 通用特性
高達(dá) 3 kV/1500 A 的運(yùn)行范圍
-50 °C 至 +250 °C 的全自動(dòng)快速熱測(cè)試
自動(dòng)創(chuàng)建功率器件（半導(dǎo)體和元器件）技術(shù)資料
自動(dòng)記錄功能可以避免數(shù)據(jù)丟失
B1506A IV 套件特性
快速的全自動(dòng)封裝和晶圓上器件 IV 測(cè)量（Ron、BV、泄漏、Vth、Vsat 等）
窄 IV 脈寬（低至 10 μs），以防止器件自熱，并測(cè)量器件真實(shí)性能
示波器視圖（時(shí)域視圖）提供實(shí)際電壓/電流脈沖波形監(jiān)測(cè)，以確保精確測(cè)量
可擴(kuò)展配置，支持添加 CV 和 Qg 功能，以及擴(kuò)展電流范圍由 20A 升至 500 A 或 1500 A
B1506A 完整套件特性
全部 IV 套件特性
高達(dá) 3 kV 的封裝器件晶體管輸入、輸出和反向轉(zhuǎn)移電容（Ciss、Coss、Crss、Cies、Coes、Cres）和柵極電阻（Rg）測(cè)量功能
封裝器件柵極電荷（Qg）曲線測(cè)量
功率損耗計(jì)算（傳導(dǎo)、驅(qū)動(dòng)和切換損耗）
Main features and technical indicators
B1506A universal features
Operating range up to 3 kV/1500 A
- 50 ° C to + 250 ° C of full automatic quick thermal test
Automatically creates technical data for power devices (semiconductors and components)
Automatic recording can avoid data loss
B1506A IV suite features
Rapid and fully automated packaging and on-wafer device IV measurement (Ron, BV, leakage, Vth, Vsat, etc.)
Narrow IV pulse width (as low as 10 s) to prevent device self-heating and to measure device true performance
The oscilloscope view (time domain view) provides actual voltage/current pulse waveform monitoring to ensure accurate measurements
Expandable configuration, support to add CV and Qg function, and extend current range from 20A to 500a or 1500a
B1506A complete suite features
All IV suite features
Transistor input, output and reverse transfer capacitance (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) measurement functions up to 3 kV
Gate charge (Qg) curve measurement of packaged devices
Power loss calculation (conduction, drive and switching losses)
